Abstract
The spatial temperature distribution of a high power Ge/Si waveguide n-i-p photodiode is experimentally obtained using a time-domain thermoreflectance imaging technique. Measurement results are shown to be in good agreement with simulated values.
© 2010 Optical Society of America
PDF ArticleMore Like This
Mengyuan Huang, Pengfei Cai, Su Li, Guanghui Hou, Naichuan Zhang, Tzung-I Su, Ching-yin Hong, and Dong Pan
W4D.6 Optical Fiber Communication Conference (OFC) 2018
Yuan Yuan, Zhihong Huang, Xiaoge Zeng, Di Liang, Marco Fiorentino, and Raymond G. Beausoleil
SW3C.2 CLEO: Science and Innovations (CLEO:S&I) 2021
Mengyuan Huang, Kiyoung Lee, Kelly Magruder, Olufemi Dosunmu, Ryan Haislmaier, Hao-Hsiang Liao, Wei Qian, Paul Martin, Jeremy Hicks, Pari Patel, Carsten Brandt, and Ansheng Liu
Th2E.2 European Conference and Exhibition on Optical Communication (ECOC) 2022