We demonstrate intensity tagging as a new approach to improve the detection sensitivity of carrier-envelope-phase tagging technique. A weak carrier-envelope-phase effect of ~1% modulation depth from a tungsten surface is thus successfully retrieved.

© 2019 The Author(s)

PDF Article


You do not have subscription access to this journal. Citation lists with outbound citation links are available to subscribers only. You may subscribe either as an OSA member, or as an authorized user of your institution.

Contact your librarian or system administrator
Login to access OSA Member Subscription