To characterize defects in organic photovoltaic devices, we develop and implement a thermoreflectance imaging technique, using it to pinpoint and monitor the behavior of “hot spots” and background signals under varying electrical bias conditions.
© 2019 The Author(s)
You do not have subscription access to this journal. Citation lists with outbound citation links are available to subscribers only. You may subscribe either as an OSA member, or as an authorized user of your institution.
Contact your librarian or system administrator
Login to access OSA Member Subscription