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Conferences > FiO > 2014 > FM4F > FM4F.5

Through-Focus OTF Based Optical Quality Testing of Whole-Slide Scanners for Digital Pathology

S.M. Shakeri, B. Hulsken, L.J. van Vliet, and S. Stallinga

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Abstract

We measure the through-focus OTF of whole slide scanners for optical quality testing and monitoring. Analysis of the OTF data gives a system level evaluation of astigmatism, field curvature, chromatic aberrations, coma and spherical aberration.

© 2014 Optical Society of America

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