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Conferences > FiO > 2013 > FTh4C > FTh4C.2

Beam Deflection Measurement of Time and Polarization Resolved Nonlinear Refraction

Manuel R. Ferdinandus, Honghua Hu, Matthew Reichert, Zuo Wang, David J. Hagan, and Eric W. Van Stryland

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Abstract

We modify the "photothermal" beam deflection technique to study ultrafast optical nonlinearities. We measure the temporal and polarization dynamics of nonlinear refraction with sensitivity of λ/5500 while separating the isotropic and reorientational components.

© 2013 Optical Society of America

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