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Conferences > FiO > 2012 > FW4J > FW4J.5

Beam Profiler for Single-Photon Applications based on Compressive Sampling Techniques

Warren Grice, Duncan Earl, Philip Evans, Dong-Sheng Guo, Travis Humble, Eric Martin, and Raphael Pooser

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Abstract

We report the development of a low-cost beam characterization technique appropriate for extremely low light levels. The technique makes use of compressive sampling strategies that have been developed recently for imaging applications.

© 2012 Optical Society of America

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