Abstract
We present measurements of the optical constants n and k of gallium-implanted silicon (Si:Ga) in the spectral range 500 − 1000 nm using ellipsometry and reflectance to assess the usefulness of this material for nanophotonics.
© 2012 Optical Society of America
PDF Article | Presentation VideoMore Like This
Elaine N. Lalanne, Hernando Garcia, A.M. Johnson, S. Vijayalakshmi, and H. Grebel
CTuE6 Conference on Lasers and Electro-Optics (CLEO:S&I) 2001
S. Vijayalakshmi, H. Grebel, and C. W. White
QWD1 Quantum Electronics and Laser Science Conference (CLEO:FS) 1999
A. C. Peacock, P. Mehta, T. D. Day, J. R. Sparks, P. J. A. Sazio, J. V. Badding, and N. Healy
FM4H.1 Frontiers in Optics (FiO) 2012