Thin Film Refractive Index by Transmission Spectroscopy

Michael Brindza; Armand Rosenberg; Guy Beadie; James S. Shirk

doi:10.1364/FIO.2012.FTu3A.5

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Frontiers in Optics 2012

Rochester, New York United States
14–18 October 2012
ISBN: 978-1-55752-956-5

From the session
Poster Session I (FTu3A)

Thin Film Refractive Index by Transmission Spectroscopy

Michael Brindza, Armand Rosenberg, Guy Beadie, and James S. Shirk

Frontiers in Optics 2012/Laser Science XXVIII
OSA Technical Digest (online) (Optical Society of America, 2012),
paper FTu3A.5
•https://doi.org/10.1364/FIO.2012.FTu3A.5

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M. Brindza, A. Rosenberg, G. Beadie, and J. S. Shirk, "Thin Film Refractive Index by Transmission Spectroscopy," in Frontiers in Optics 2012/Laser Science XXVIII, OSA Technical Digest (online) (Optical Society of America, 2012), paper FTu3A.5.

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Optics & Photonics Topics
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The topics in this list come from the OSA Optics and Photonics Topics applied to this article.
Previously assigned OCIS codes
- Fringe analysis (120.2650)
- Optical constants (120.4530)

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Abstract

We present a method by which etalon transmission fringes and prism coupling refractometer measurements are combined to reduce the errors in thin (10s of μm) film refractive index values.

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Abstract

Frontiers in Optics 2012

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