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  • Frontiers in Optics 2009/Laser Science XXV/Fall 2009 OSA Optics & Photonics Technical Digest
  • OSA Technical Digest (CD) (Optica Publishing Group, 2009),
  • paper JWC11
  • https://doi.org/10.1364/FIO.2009.JWC11

Accurate measurement of refractive indices of optical wafers by using Fabry-Perot type interference

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Abstract

We investigated Fabry-Perot type interference from optical wafers to measure the refractive indices. This method is accurate (~10-5 for fused silica), insensitive to environmental perturbation, and simple to implement, compared to the conventional index-measurement methods.

© 2009 Optical Society of America

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