Expand this Topic clickable element to expand a topic
Skip to content
Optica Publishing Group

Strong probe scattering in NSOM

Not Accessible

Your library or personal account may give you access

Abstract

We discuss a model for tip-sample interactions in near-field scanning microscopy. The sample is treated perturbatively while the Born series for the interactions with the tip are resummed, keeping terms to all orders in the tip and only first order in the sample. That is, we treat the case that the tip is a strong scatterer while the sample is weak.

© 2006 Optical Society of America

PDF Article
More Like This
Control of Emitted Fields from Apertureless NSOM Probes through Structuring of Metal Coating Layer

Wataru Nakagawa, Luciana Vaccaro, Hans Peter Herzig, and Christian Hafner
FTuT4 Frontiers in Optics (FiO) 2006

Influence of tip fields on NSOM Imaging

Garnett W. Bryant and Ansheng Liu
QWD22 Quantum Electronics and Laser Science Conference (CLEO:FS) 1999

Influence of a NSOM probe shape on a photonic crystal microcavity mode coupling

Gaëlle Le Gac, Christian Seassal, Emmanuel Picard, Emmanuel Hadji, and Ségolène Callard
CK2_5 The European Conference on Lasers and Electro-Optics (CLEO/Europe) 2009

Select as filters


Select Topics Cancel
© Copyright 2024 | Optica Publishing Group. All Rights Reserved