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  • Frontiers in Optics 2004/Laser Science XXII/Diffractive Optics and Micro-Optics/Optical Fabrication and Testing
  • OSA Technical Digest Series (Optica Publishing Group, 2004),
  • paper JWA10
  • https://doi.org/10.1364/FIO.2004.JWA10

Excitation correlation spectroscopy of semiconductors in the mid-infrared

Open Access Open Access

Abstract

We describe the extension of excitation correlation to the mid-infrared. This novel technique provides a convenient alternative to more complicated optical pump-probe and time-resolved photoluminescence approaches for investigating electron-hole recombination and radiative processes in semiconductors. Excitation correlation is used to determine the recombination coefficients for a GaInSb/InAs superlattice. Full-text article is not available.

© 2004 Optical Society of America


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