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Optica Publishing Group
  • Frontiers in Optics 2004/Laser Science XXII/Diffractive Optics and Micro-Optics/Optical Fabrication and Testing
  • OSA Technical Digest Series (Optica Publishing Group, 2004),
  • paper FWH53
  • https://doi.org/10.1364/FIO.2004.FWH53

Polarization influence on the sensitivity to side -wall roughness in ultra-small square SOI waveguides

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Abstract

Numerical investigations of scattering loss induced by side -wall roughness are performed for SOI square strip waveguides under quasi -TE and quasi-TM polarizations. Propagation loss is calculated for waveguide sizes ranging from 500nm to 100nm . Simulations show when the incident fundamental mode polarization is a quasi -TM one, lower propagation loss is expected.

© 2004 Optical Society of America

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