Expand this Topic clickable element to expand a topic
Skip to content
Optica Publishing Group
  • Frontiers in Optics 2004/Laser Science XXII/Diffractive Optics and Micro-Optics/Optical Fabrication and Testing
  • OSA Technical Digest Series (Optica Publishing Group, 2004),
  • paper FWH31
  • https://doi.org/10.1364/FIO.2004.FWH31

Quantifying optical feedback into semiconductor lasers by thermal profiling

Not Accessible

Your library or personal account may give you access

Abstract

We present a thermal profiling technique for monitoring optical feedback into semiconductor lasers that is ideal for photonic integrated circuits. This method allows quantitative measurement of both the optical output power and the magnitude of optical feedback without the need for access to the optical output of the laser.

© 2004 Optical Society of America

PDF Article
More Like This
Using Thermal Profiling to Quantify Optical Feedback into Semiconductor Lasers

Evelyn Kapusta, Dietrich Lüerfien, and Janice Hudgings
JTuC78 Conference on Lasers and Electro-Optics (CLEO:S&I) 2005

Thermal Profiling of Gain Saturation in Semiconductor Optical Amplifiers

Dietrich Lüerßen, Janice Hudgings, Rajeev J. Ram, Edward Clausen, and Angela Hohl-AbiChedid
CMJ6 Conference on Lasers and Electro-Optics (CLEO:S&I) 2004

Determining the fiber coupling efficiency of a semiconductor optical amplifier without direct optical measurement

Bidita Jawher Tithi, Elizabeth Fenstermacher, Dietrich Lüerßen, and Janice Hudgings
FWH54 Frontiers in Optics (FiO) 2004

Select as filters


Select Topics Cancel
© Copyright 2024 | Optica Publishing Group. All Rights Reserved