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Optica Publishing Group
  • Frontiers in Optics 2004/Laser Science XXII/Diffractive Optics and Micro-Optics/Optical Fabrication and Testing
  • OSA Technical Digest Series (Optica Publishing Group, 2004),
  • paper FWH10
  • https://doi.org/10.1364/FIO.2004.FWH10

Microscopic imaging of defect density distribution in InGaP and GaN using the decay time of photo-excited carriers

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Abstract

With pump-probe laser measurements of transient reflectivity representing the photo-excited carrier lifetime, we obtained two-dimensional images of the defect density distribution for InGaP and GaN. The defect distributions are compared with cathode-luminescence images.

© 2004 Optical Society of America

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