Enhanced Sensitivity of Nano-FTIR Spectroscopy

Peter Hermann; Bernd Kästner; Arne Hoehl; Piotr Patoka; Georg Ulrich; Eckart Rühl; Gerhard Ulm

doi:10.1364/FTS.2016.FTu2E.2

Light, Energy and the Environment
OSA Technical Digest (online) (Optica Publishing Group, 2016),
paper FTu2E.2
•https://doi.org/10.1364/FTS.2016.FTu2E.2

Enhanced Sensitivity of Nano-FTIR Spectroscopy

Peter Hermann, Bernd Kästner, Arne Hoehl, Piotr Patoka, Georg Ulrich, Eckart Rühl, and Gerhard Ulm

Fourier Transform Spectroscopy 2016

Leipzig Germany
14–17 November 2016
ISBN: 978-0-9600380-4-6

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Nano- and Micro- spectroscopy and Imaging (FTu2E)

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P. Hermann, B. Kästner, A. Hoehl, P. Patoka, G. Ulrich, E. Rühl, and G. Ulm, "Enhanced Sensitivity of Nano-FTIR Spectroscopy," in Light, Energy and the Environment, OSA Technical Digest (online) (Optica Publishing Group, 2016), paper FTu2E.2.

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Abstract

Nano-FTIR spectroscopy enables spectroscopic surface characterization at nanometer scale spatial resolution using a broadband infrared radiation source. We will report on the effect of spectral filtering to significantly enhance the sensitivity of this method.

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