We present a new system that combines a Fourier transform infrared spectrometer with a near-field microscope to achieve subwavelength spatial resolution for mid-IR spectroscopy. Sub-micrometer to nanometer scale chemical structure analysis is attained in IR region.

© 2003 Optical Society of America

PDF Article


You do not have subscription access to this journal. Citation lists with outbound citation links are available to subscribers only. You may subscribe either as an OSA member, or as an authorized user of your institution.

Contact your librarian or system administrator
Login to access OSA Member Subscription