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Conferences > FTS > 1999 > FWE > FWE19

Evaluation of FT-IR Measurement Accuracy in Transmittance and Reflectance Measurements

L. M. Hanssen and S. G. Kaplan

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Abstract

FT-IR spectroscopy is susceptible to numerous sources of error, any number of which can potentially result in large measurement errors.

© 1999 Optical Society of America

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