Abstract
Atom-based detection of microwave fields provides advantages for SI-traceable measurements, sub-wavelength resolution, accuracy, precision and long-term reproducible operation comparing to the traditional technology with an antenna and a solid-state detector. The microwave (MW) electrometry, based on optical spectroscopy of atomic Rydberg states in a vapor cell [1], gained recent interest for technological development of compact devices for electric field sensing and imaging. This contribution proposes a new approach towards terahertz (THz) electrometry by precision infrared spectroscopy of cold trapped HD+ ions.
© 2019 IEEE
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