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  • 2019 Conference on Lasers and Electro-Optics Europe and European Quantum Electronics Conference
  • OSA Technical Digest (Optica Publishing Group, 2019),
  • paper ef_p_29

Direct Measurement of Cross-Phase Modulation in Microresonators

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Abstract

The Kerr effect in microresonators is usually masked by thermal effects [1], as resonances can thermally drift on the order of a few GHz, compared to Kerr effect shifts of a few MHz. However, the Kerr effect, and in particular cross-phase modulation (XPM), is responsible for important effects seen in microresonators. For instance, it can be indirectly observed in solitons [2], as well as being the primary mechanism driving symmetry breaking of counter-propagating light in microresonators [3–5]. By direct measurement, the effective mode area can also be extracted by measuring the XPM-induced resonance shift.

© 2019 IEEE

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