Abstract

We demonstrate a direct Shack-Hartmann wavefront sensing method that allows depth-resolved measurements. A coherence-gate Shack-Hartmann wavefront sensor (CG/SH-WFS) is implemented by adding low coherence reflectometry gating to a SH-WFS. The depth resolution is determined by the coherence gate, much narrower than the depth range of the SH-WFS. Distinctive wavefronts are measured from five layers in a multiple-layer target. This paves the way towards depth-resolved closed-loop adaptive optics assisted microscopy and imaging of the retina.

© 2013 SPIE

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