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Darkfield scattering spectroscopic microscopy evaluation using polystyrene beads

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Abstract

Diameters of single polystyrene beads were determined within ~10 nm accuracy by comparing Mie theory oscillations and wavelength resolved measurements. The setup is realized with an axicon supported reflected darkfield microscope and is herein presented in detail. Further we explain a theoretical model considering the effective numerical aperature of the measuring system. A fitting algorithm allows rapid characterization of the sphere diameters.

© 2009 OSA/SPIE

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