Abstract

We have investigated a method for solving the inverse problem of multi-layer turbid medium, from the spatially-resolved frequency-domain diffuse reflectance, based on detecting only the photons migrated within specific layer(s). According to the layers thickness, we can define a number of limiting detectors positions for each layer (dl,d2,d3, .. dn), using a depth sensitivity profile, such that the detected reflectance result (with >95% confidence) from photons propagated not deep than the (151 ,2°d ,3rc1 , .... and nth layer) respectively. Thus each layer is characterized sequentially from the reflectance data confined to the corresponding detector position. We have developed a diffuse reflectance measurements apparatus and test the method experimentally on a number of two-layer phantoms. The results show that the phantoms optical properties could be deduced with errors <20% in relatively short times (<lmin).

© 2003 SPIE