Abstract

Over 1000 hour reliability test for three samples of Cz-grown BBO in 100 mW-266 nm generation revealed the cavity loss increase was as small as 5×10−5 %/hour at the generated UV power density of 260 W/cm2, while in pulsed 266 nm generation at 7 kHz, scattering loss increase in the BBO measured 0.05%/hour at 31 MW/cm2.

© 1998 Optical Society of America

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