Near-field refractive index and film thickness on prism or metal surface can be determined, by measuring the complex amplitude distributions of reflected light in total internal reflection and surface plasma resonance using digital holographic interferometry.

© 2018 The Author(s)

PDF Article


You do not have subscription access to this journal. Citation lists with outbound citation links are available to subscribers only. You may subscribe either as an OSA member, or as an authorized user of your institution.

Contact your librarian or system administrator
Login to access OSA Member Subscription