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Conferences > COSI > 2019 > CW4A > CW4A.4

High-resolution Imaging of Nanoparticles in Wide-field Interferometric Scattering Microscopy

Celalettin Yurdakul, Oguzhan Avci, Alex Matlock, Lei Tian, Ekmel Ozbay, and M. Selim Ünlii

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Abstract

Single particle interferometric scattering microscopy has demonstrated great capability in label-free imaging of sub-wavelength dielectric nanoparticles (r<25 nm); however, it suffers from diffraction-limited resolution. Here, we demonstrate ~2-fold improvement in lateral resolution upon asymmetric illumination.

© 2019 The Author(s)

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