Microscopic PSF estimation and resolution enhancement by speckle pattern illumination

N. Meitav; N. Meitav; E. N. Ribak; S. Shoham

doi:10.1364/COSI.2016.CT1D.3

Imaging and Applied Optics 2016
OSA Technical Digest (online) (Optica Publishing Group, 2016),
paper CT1D.3
•https://doi.org/10.1364/COSI.2016.CT1D.3

Microscopic PSF estimation and resolution enhancement by speckle pattern illumination

N. Meitav, E. N. Ribak, and S. Shoham

Computational Optical Sensing and Imaging 2016

Heidelberg Germany
25–28 July 2016
ISBN: 978-1-943580-15-6

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Phase Imaging I (CT1D)

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N. Meitav, E. N. Ribak, and S. Shoham, "Microscopic PSF estimation and resolution enhancement by speckle pattern illumination," in Imaging and Applied Optics 2016, OSA Technical Digest (online) (Optica Publishing Group, 2016), paper CT1D.3.

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Abstract

A method for estimating the PSF of an imaging system by projecting a speckle pattern onto the imaged object is presented. This provides a critical measure of the imaging performance and of the presence of aberrations.

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