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Conferences > CLEO_SI > 2020 > SW3F > SW3F.7

Spectral Interferometric Microscopy for Fast and Broadband Phase Characterization

Lior Michaeli, Danielle Ben Haim, Haim Suchowski, and Tal Ellenbogen

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Abstract

We introduce a novel interferometric method for fast, broadband and microscopic phase characterization, based on common-path configuration. The method can be implemented by adding a simple optical relay to connect conventional microscope and imaging spectrometer.

© 2020 The Author(s)

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