Abstract

We show that relative beam displacement measurements with two-mode squeezed light sources are identical to truncated SU(1,1) interferometers, enabling a new quantum-enhanced atomic force microscopy suitable for broadband characterization of high-speed dynamics in materials.

© 2019 The Author(s)

PDF Article
More Like This
Advanced Characterization and Sensing with Squeezed Optomechanical Systems

R. C. Pooser, N. Savino, E. Batson, J.L. Beckey, J. Garcia, and B.J. Lawrie
LTh2G.5 Laser Science (LS) 2020

Atomic Force Microscopy Beyond the Standard Quantum Limit

B.J. Lawrie and R.C. Pooser
JF2B.3 CLEO: Applications and Technology (CLEO_AT) 2018

Ultrasensitive measurement of MEMS cantilever displacement below the photon shot noise limit

B. J. Lawrie and R. C. Pooser
FM1A.2 CLEO: QELS_Fundamental Science (CLEO_QELS) 2014

References

You do not have subscription access to this journal. Citation lists with outbound citation links are available to subscribers only. You may subscribe either as an OSA member, or as an authorized user of your institution.

Contact your librarian or system administrator
or
Login to access OSA Member Subscription