Abstract
The temperature-dependent expansion coefficient α(T) in strain-tailored semiconductor air-gap heterostructures (AGHs) has be measured via static x-ray diffraction (XRD). Results show significant deviation from comparable thin-film systems and point to a structural blocking of high-frequency LA and optical phonon modes. Time-dependent XRD measurements reveal different thermal transport regimes on picosecond and nanosecond timescales.
© 2017 Optical Society of America
PDF ArticleMore Like This
Maheshwar Ghimire and Chuji Wang
SeW1E.4 Optical Sensors (Sensors) 2017
Peter Q. Liu, John L. Reno, and Igal Brener
FTh3F.8 CLEO: QELS_Fundamental Science (CLEO:FS) 2017
D. Ariosa
WA6 Physics of X-Ray Multilayer Structures (PXRAYMS) 1992