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Conferences > CLEO_SI > 2017 > SW4K > SW4K.4

Near Infrared Emission from Defect States of Atomically Thin Phosphorene

Shahriar Aghaeimeibodi, Je-Hyung Kim, and Edo Waks

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Abstract

We demonstrate a new class of near infrared localized defects in few layer phosphorene. This work highlights the significance of defect states of phosphorene for near infrared optoelectronic applications.

© 2017 Optical Society of America

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