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An Apodized-Imaged Hartmann Mask for Quantitative Wavefront Measurements in Laser Systems

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Abstract

A Hartmann mask with apodized holes is demonstrated for in-situ wavefront characterization in laser systems with existing near-field imaging diagnostics. Spatially dithered binary pixelated apertures alleviate diffraction effects and improve the measurement accuracy.

© 2017 Optical Society of America

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