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Conferences > CLEO_SI > 2017 > SF1K > SF1K.7

Velocity Map Imaging for Photocathode Characterization

Hong Ye, Sebastian H. Trippel, Michele Di Fraia, Arya Fallahi, Oliver D. Mücke, Jochen Küpper, and Franz X. Kärtner

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Abstract

A velocity map imaging spectrometer (VMI) to characterize the transverse phase space of electron emission from solid surfaces is described. A first instrument test is presented using multi-photon emission from a planar Au surface.

© 2017 Optical Society of America

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