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Time-domain Interferometric Characterization of Nonlinear and Thermal-induced Phase-shift in Silicon Waveguides

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Abstract

Time-domain interferometry is used to simultaneously characterize nonlinear and self-heating phase-shifts in silicon waveguides under long-pulse optical pumping. Applied to a strip waveguide, the method enabled measurements of both stationary phase-shifts and thermal time constant.

© 2016 Optical Society of America

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