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Conferences > CLEO_SI > 2015 > STu4I > STu4I.4

Near Field Optical Measurements of Silicon Waveguide in Mid-IR Regime Using Scanning Thermal Microscopy

Meir Grajower, Yoel Sebbag, Alex Naiman, Boris Desiatov, and Uriel Levy

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Abstract

We observe for the first time the near field optical intensity distribution of silicon nanophotonic devices operating in the mid-IR spectrum using our scanning thermal microscopy and demonstrate its advantages over conventional NSOM technique.

© 2015 Optical Society of America

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