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Conferences > CLEO_SI > 2014 > SM2H > SM2H.2

Silicon Wire Refractive Index Characterization using Microring Resonator Effective Length from Interferograms

Shih-Hsiang Hsu, Yung-Chia Yang, and Yu-Hou Su

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Abstract

The optical low-coherence interferometry built with an optical ruler was proposed to demonstrate silicon-wire transverse-magnetic polarized indices of refraction and birefringence as 2.02 and 0.64, respectively, from the microring resonator effective length using various interferograms.

© 2014 Optical Society of America

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