Abstract
NIF’s ability to deliver precise, high-contrast pulses is limited by the fidelity of our numerical model. Model fidelity is enhanced by fitting small-signal gain and saturation parameters to measurements and by including temporal overlap effects.
© 2013 Optical Society of America
PDF ArticleMore Like This
Steven T. Yang, Claudio Santiago, Brett Raymond, Sam Schrauth, and Kathleen McCandless
SM5E.4 CLEO: Science and Innovations (CLEO:S&I) 2022
C.A. Haynam, P. J. Wegner, G. M. Heestand, E. Moses, R. A. Sacks, M. W. Bowers, S. N. Dixit, G. V. Erbert, M. A. Henesian, M. R. Hermann, K. S. Jancaitis, K. Knittel, T. Kohut, K. R. Manes, C. D. Marshall, N. C. Mehta, J. Menapace, J. R. Murray, M. C. Nostrand, C. D. Orth, R. Patterson, R. Saunders, M. J. Shaw, M. Spaeth, S. B. Sutton, W. H. Williams, C. C. Widmayer, R. K. White, S. T. Yang, and B. M. Van Wonterghem
CFQ1 Conference on Lasers and Electro-Optics (CLEO:S&I) 2008
Don Browning, John K. Crane, C. Brent Dane, Mark Henesian, Mikael Martinez, Bryan Moran, Frank Penko, Joshua E. Rothenberg, and Russell B. Wilcox
CThE7 Conference on Lasers and Electro-Optics (CLEO:S&I) 1998