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Investigation of Photoexcited Carrier Responses in a Solar Cell with a Dynamic Terahertz Emission Microscope

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Abstract

We applied a pump-probe laser terahertz emission microscope to investigate dynamic response of photoexited carriers in a solar cell. We could clearly observe the change of terahertz radiation at the grain boundary in the polycrystalline silicon solar cell using the pump-probe methods , which could not be obtained by simple terahertz emission imaging.

© 2013 Optical Society of America

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