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Conferences > CLEO_SI > 2013 > CF2F > CF2F.4

Linewidth Measurement of 1550 nm High Contrast Grating MEMS-VCSELs

Weijian Yang, Yi Rao, Chris Chase, Michael C. Y. Huang, and Connie J. Chang-Hasnain

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Abstract

A new measurement scheme to characterize MEMS-VCSEL linewidths is demonstrated. Linewidth in the range of 40~60MHz is measured for 1550-nm high contrast grating VCSELs. We identify key contributors of the Brownian-motion-induced broadening for future optimization.

© 2013 Optical Society of America

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