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Conferences > CLEO_SI > 2012 > JW4A > JW4A.74

Two-Tone Measurement of the Nonlinear Behavior of a Silicon-on-Insulator (SOI) Ring Resonator

S. J. Spector, S. Yegnanarayanan, R. B. Swint, T. M. Lyszczarz, and P. W. Juodawlkis

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Abstract

The nonlinearity of a SOI ring resonator was measured using a two-tone method. At frequencies near 10 MHz, 1.5 mW causes significant signal degradation. At frequencies near 1 GHz, little signal degradation is seen.

© 2012 Optical Society of America

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