Reconstruction of tightly focused beams using Mie-scattering

Thomas Bauer; Sergej Orlov; Ulf Peschel; Peter Banzer; Gerd Leuchs

doi:10.1364/CLEO_SI.2012.CF3C.8

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CLEO: Science and Innovations 2012

San Jose, California United States
6–11 May 2012
ISBN: 978-1-55752-943-5

From the session
Precision Imaging and Sensing (CF3C)

Reconstruction of tightly focused beams using Mie-scattering

Thomas Bauer, Sergej Orlov, Ulf Peschel, Peter Banzer, and Gerd Leuchs

Conference on Lasers and Electro-Optics 2012
OSA Technical Digest (online) (Optical Society of America, 2012),
paper CF3C.8
•https://doi.org/10.1364/CLEO_SI.2012.CF3C.8

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T. Bauer, S. Orlov, U. Peschel, P. Banzer, and G. Leuchs, "Reconstruction of tightly focused beams using Mie-scattering," in Conference on Lasers and Electro-Optics 2012, OSA Technical Digest (online) (Optical Society of America, 2012), paper CF3C.8.

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Related Topics
Optics & Photonics Topics
?

The topics in this list come from the OSA Optics and Photonics Topics applied to this article.
- High numerical aperture optics
- Mie theory
Previously assigned OCIS codes
- Scattering measurements (120.5820)
- Scanning microscopy (180.5810)

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Abstract

By using a sub-wavelength nano-particle as a field probe and a tailored detection scheme we are able to reconstruct the electric energy density in the focal plane of a high numerical aperture focusing system.

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Abstract

CLEO: Science and Innovations 2012

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