Non-axial-scanning Second Harmonic Microscopy

Chuan Yang; Kebin Shi; Haifeng Li; Qian Xu; Venkatraman Gopalan; Zhiwen Liu

doi:10.1364/CLEO_AT.2011.JThB82

CLEO:2011 - Laser Applications to Photonic Applications
OSA Technical Digest (CD) (Optica Publishing Group, 2011),
paper JThB82
•https://doi.org/10.1364/CLEO_AT.2011.JThB82

Non-axial-scanning Second Harmonic Microscopy

Chuan Yang, Kebin Shi, Haifeng Li, Qian Xu, Venkatraman Gopalan, and Zhiwen Liu

CLEO: Science and Innovations 2011

Baltimore, Maryland United States
1–6 May 2011
ISBN: 978-1-55752-910-7

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Nonlinear and Quantum Science and Measurements Joint Poster Session (JThB)

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C. Yang, K. Shi, H. Li, Q. Xu, V. Gopalan, and Z. Liu, "Non-axial-scanning Second Harmonic Microscopy," in CLEO:2011 - Laser Applications to Photonic Applications, OSA Technical Digest (CD) (Optica Publishing Group, 2011), paper JThB82.

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Abstract

We demonstrate a chromatic second harmonic imaging technique that exploits the chromatic aberration of a Fresnel lens to focus different wavelengths into different axial positions to effectively realize axial scanning and improve imaging speed.

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