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Experimental Demonstration of Self-Phase-Modulation Induced Wavelength Shift in an 80-nm thick ITO-ENZ Material in the Telecom c Band

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Abstract

We experimentally demonstrate self-phase-modulation-induced wavelength silifl of up- to 15 nm in an 80-nm-tliick ITO at a zero-permittivity wavelength of 1550 nm. We also explore tlie effect oftlie pmnp pulse temporal duration on tlie wavelength silift.

© 2020 The Author(s)

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