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Sampling the Terahertz Near-Field in Ultrafast Terahertz Scanning Tunneling Microscopy

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Abstract

We demonstrate that 800 nm femtosecond pulses focused onto the tip of an ultrafast terahertz scanning tunneling microscope (THz-STM) can be used to sample the terahertz electric near-field at the tip apex.

© 2018 The Author(s)

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