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Conferences > CLEO_QELS > 2016 > JTu5A > JTu5A.68

Dual-probe Scanning Near-field Optical Microscopy (DSNOM) Utilizing Ultrafast Plasmon Nano-focusing

Yasuhiro Kojima, Yuta Masaki, and Fumihiko Kannari

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Abstract

Dual-probe scanning near-field optical microscopy combining spectral interferometry (SI-DSNOM) which utilizes ultrafast surface-plasmon polariton nanofocusing as excitation light is constructed and experimentally demonstrated. We achieve spatiotemporal resolution of 100 nm and 10 fs.

© 2016 Optical Society of America

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