Abstract

The implementation of a structured illumination microscopy (SIM) is based on the design of optical setup and image reconstruction algorithm. In the optical setup, a reflective spatial light modulator (SLM) was used to generate structured illumination. In this method, periodic sinusoidal illumination is used instead of the uniform illumination in conventional microscopes. Moreover, we developed a code in MATLAB software to extract higher order k-numbers which are missing in the system optical transfer function [1]. However, SI microscopy is highly sensitive to PSF variation. Accordingly, precise measurement of the PSF is the most important parameter for efficient SI microscopy. The point spread function are measured through an experimental and analytical method using the maximum likelihood estimation algorithm [2].

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