Ultrashort laser pulses have become an indispensable tool in physics, chemistry and engineering. Their numerous applications call for accurate and robust characterization techniques able to reliably retrieve the pulse’s intensity profile. Different methods, such as FROG [1] or SPIDER [2] and their variants, have been developed in past decades and are now common in many laboratories. More novel approaches based on manipulating the light’s spectral phase include techniques like MIIPS [3] and dispersion scan (d-scan) [4].

© 2019 IEEE

PDF Article


You do not have subscription access to this journal. Citation lists with outbound citation links are available to subscribers only. You may subscribe either as an OSA member, or as an authorized user of your institution.

Contact your librarian or system administrator
Login to access OSA Member Subscription