Abstract

In this work we demonstrate the first self-diffraction dispersion-scan (SD d-scan) measurements of a near-UV supercontinuum source produced by multiplate continuum (MPC) [1]. Due to the nature of the spectral broadening, the emerging MPC beam presents spatio-spectral inhomogeneities. Such inhomogeneities can be a hindrance when attempting to characterize a pulse via self-diffraction-based schemes (as normally required when measuring ultraviolet pulses), since ultrashort pulse measurement techniques generally assume and rely on nonlinear effects generated by replicas of the same pulse, which in this case is an invalid assumption. While some techniques are able to provide full spatio-temporal characterization of a pulse, such techniques can be quite complex in nature. When a full spatio-temporal characterization is not deemed necessary, e.g., in the case where only two portions/pulses from the same beam must be known, we can apply a self-diffraction d-scan [2] scheme to simultaneously characterize the two pulses from the measurement of only one d-scan trace (Fig. 1), which we call dual SD d-scan.

© 2019 IEEE

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