Expand this Topic clickable element to expand a topic
Skip to content
Optica Publishing Group
  • 2017 European Conference on Lasers and Electro-Optics and European Quantum Electronics Conference
  • (Optica Publishing Group, 2017),
  • paper CG_7_3

The ion microscope as a tool for imaging the ion distribution produced by linear and non-linear processes at the focus of an XUV beam

Not Accessible

Your library or personal account may give you access

Abstract

We demonstrate a tool for quantitative measurements in the linear and non-linear extreme ultraviolet (XUV) spectral region measuring spatially resolved atomic ionization products at the focus of an XUV beam [1, 2]. The ionizing radiation is a comb of the 11th–15th harmonics of a Ti:Sapphire femtosecond laser beam produced in a Xenon gas jet. The spatial ion distribution at the focus of the harmonics is recorded using an ion microscope detector [2, 3]. Spatially resolved single- and two-photon ionization products of Argon and Helium are observed. From such ion distributions single- and two-photon generalized cross sections have be extracted by a self-calibrating method. This is the first observation of spatially resolved two-XUV-photon ionization at the focus of the XUV radiation which constitutes an important step towards future single-shot temporal characterization of attosecond (asec) pulses [4].

© 2017 IEEE

PDF Article
More Like This
Photoelectron Spetrometry of XUV Multiphoton processes in Helium

A. Bouhal, P. Breger, P. Agostini, R. Constantinescu, H. G. Muller, L. F. DiMauro, G. Hamoniaux, A. Mysyrowicz, and A. Antonetti
FD2 Applications of High Field and Short Wavelength Sources (HFSW) 1997

Table-top XUV Beamline for Coherent Diffractive Imaging of Isolated Gas-phase Nanoparticles

Björn Senfftleben, Martin Kretschmar, Andreas Hoffmann, Mario Sauppe, Johannes Tümmler, Ingo Will, Tamás Nagy, Marc J.J. Vrakking, Daniela Rupp, and Bernd Schütte
EW3A.2 Compact EUV & X-ray Light Sources (EUVXRAY) 2020

Photoelectron spectroscopy of two photon ionization processes in XUV produced by a superposition of high order harmonics

K. Furusawa, T. Okino, T. Shimizu, H. Hasegawa, Y. Nabekawa, K. Yamanouchi, and K. Midorikawa
JFA4 Conference on Lasers and Electro-Optics (CLEO:S&I) 2006

Select as filters


Select Topics Cancel
© Copyright 2024 | Optica Publishing Group. All rights reserved, including rights for text and data mining and training of artificial technologies or similar technologies.