Abstract
Stabilizing the carrier-envelope phase (CEP) of mode-locked laser sources has made tremendous progress in recent years, enabling the generation of isolated attosecond pulses and precision frequency metrology at the 10-18 uncertainty level. While some laser types can be very well stabilized, other interesting laser materials have proven notoriously difficult or even impossible to be CEP stabilized. The exact mechanisms behind these problems are poorly understood. Here, we present a novel diagnostic method that provides unprecedented insight into the inner workings of noise generating mechanisms in laser oscillators.
© 2017 IEEE
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