Abstract

Surface-enhanced Raman scattering (SERS) is a valuable analytical phenomenon that allows for highly sensitive structural detection of low concentration analytes in the presence of nanometre-sized metallic particles. The SERS enhancement depends strongly on the nanoparticle size, shape and spatial distribution. As a result, recent research has been focused on the development of SERS substrates [1] using e-beam and nanolithography methods, focused ion beam milling and template directed synthesis.

© 2015 IEEE

PDF Article

References

You do not have subscription access to this journal. Citation lists with outbound citation links are available to subscribers only. You may subscribe either as an OSA member, or as an authorized user of your institution.

Contact your librarian or system administrator
or
Login to access OSA Member Subscription